Japanese Inventor Develops Reflected Light Intensity Ratio Measuring Device
Copyright © Targeted News Service 2008
2008-10-27
ALEXANDRIA, Va., Oct. 27 -- Hirotsugu Kaihori of Kyoto, Japan, has developed a device for measuring light energy absorption ratio.
According to the abstract released by the U.S. Patent & Trademark Office: "A measuring optical system for emitting and receiving light is fixedly installed in a ceiling portion of a measuring device, and a wafer holding part for supporting a semiconductor wafer is provided in a bottom portion of the measuring device. A support table is horizontally lai . . .
According to the abstract released by the U.S. Patent & Trademark Office: "A measuring optical system for emitting and receiving light is fixedly installed in a ceiling portion of a measuring device, and a wafer holding part for supporting a semiconductor wafer is provided in a bottom portion of the measuring device. A support table is horizontally lai . . .