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German Inventors Develop Examination Object Nondestructive Analysis System

2008-10-25

ALEXANDRIA, Va., Oct. 25 -- Joachim Baumann, Martin Engelhardt and Manfred Schuster, all from Munchen, Germany, Martin Hoheisel, Thomas Mertelmeier and Stefan Popescu, all from Erlangen, Germany, Eckhard Hempel of Furth, Germany, and Jorg Freudenberger of Eckental, Germany, have developed a method for examination object nondestructive analysis.

According to the abstract released by the U.S. Patent & Trademark Office: "A method and a measuring arrangement are disclosed for nondestr . . .

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German Inventors Develop Examination Object Nondestructive Analysis System

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Copyright Targeted News Service 2008